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   :: 3030CE In-Circuit Tester compact extended
High throughput. High coverage. Fully compatible with 3030 Inline
  3030CE can be equipped with up to 2 independent Cores - each one with independent CPU, local memory and instrumentation - able to test in parallel up to 2 boards/panels of boards. Compared to standard ICT testers, 3030CE throughput is up to 200% higher, thus minimizing the cost of board testing.
  Key Features
  » True 2x Parallel Test
  » Fixture compatible with 3030 Inline
  » High-speed parametric ICT
  » Automatic application development
  » Multiple test functions
  » Easy diagnostic of fixture's pogo pins via mobile app
3030CE In-Circuit Tester compact extended
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